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2013
Sub-diffraction phase-contrast imaging of transparent nano-objects by plasmonic lens structure
Nanotechnology
135203
2013
The error analysis and correcting of scale tape grating encoder
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications
89052Y
2013
Hybrid terahertz metamaterial structure formed by assembling a split ring resonator with a metal mesh
Science China: Physics, Mechanics and Astronomy
882-887
2013
Superlens imaging lithography for high aspect ratio sub-wavelength pattern employing trilayer resist process
Microelectronic Engineering
35-39
2013
Design and location deviation of the computer generated holograms used for aspheric surface testing
Proceedings of SPIE: Optical Measurement Systems for Industrial Inspection VIII
87882O
2013
Research on minimum resolvable contrast of the telescope
2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013: Optoelectronics Engineering and Information Technologies in Industry-Advanced Materials Research
15-19
2013
Wavefront testing of pinhole based on point diffraction interferometer
Proceedings of SPIE: Optical Microlithography XXVI
86832F
2013
Theoretical and experimental study of a catadioptric compensator for an aspheric surface
Applied Optics
6834-6839
2013
Optical surface measurement using phase retrieval hybrid algorithm based on diffraction angular spectrum theory
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications
891111
2013
Engineering localized hotspot both in transversal and longitudinal direction by plasmonic coupling between nano-particles and reflective metallic film
Chinese Optics Letters
S22401
2013
Effect of fabrication errors on binary optical element imaging quality
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications
89110O
2013
Vector analysis of two-dimensional Ronchi grating in the metrology system
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications
89110J
2013
Design and analysis of a novel self-deployable baffle
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
890758
2013
The impact of polarization on metrology performance of the lateral shearing interferometer
Proceedings of SPIE: Optical Measurement Systems for Industrial Inspection VIII
87882F
2013
1.5 kW incoherent beam combining of four fiber lasers using adaptive fiber-optics collimators
IEEE Photonics Technology Letters
1286-1289
2013
Speed-up single image dehazing using double dark channels
Proceedings of SPIE: Fifth International Conference on Digital Image Processing, ICDIP 2013
88780A
2013
Prediction control algorithm for close-loop adaptive optical system
6th IFAC Symposium on Mechatronic Systems, MECH 2013
276-284
2013
Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements
Optics Letters
40-42
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