所长信箱  |  联系我们  |  English  |  中国科学院
首 页 研究生教育 出版物 信息公开
科研成果
  研究领域
  概况介绍
  获奖信息
  论文
  专著
  专利
  高科技产品
  IR机构知识库
  成果转化
论文 当期位置:首页 > 科研成果 > 论文
论文题目: 发表年度: 第一作者:
 
年度 论文题目 期刊 收录情况
2013 Sub-diffraction phase-contrast imaging of transparent nano-objects by plasmonic lens structure Nanotechnology 135203
2013 The error analysis and correcting of scale tape grating encoder Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications 89052Y
2013 Hybrid terahertz metamaterial structure formed by assembling a split ring resonator with a metal mesh Science China: Physics, Mechanics and Astronomy 882-887
2013 Superlens imaging lithography for high aspect ratio sub-wavelength pattern employing trilayer resist process Microelectronic Engineering 35-39
2013 Design and location deviation of the computer generated holograms used for aspheric surface testing Proceedings of SPIE: Optical Measurement Systems for Industrial Inspection VIII 87882O
2013 Research on minimum resolvable contrast of the telescope 2nd International Conference on Opto-Electronics Engineering and Materials Research, OEMR 2013: Optoelectronics Engineering and Information Technologies in Industry-Advanced Materials Research 15-19
2013 Wavefront testing of pinhole based on point diffraction interferometer Proceedings of SPIE: Optical Microlithography XXVI 86832F
2013 Theoretical and experimental study of a catadioptric compensator for an aspheric surface Applied Optics 6834-6839
2013 Optical surface measurement using phase retrieval hybrid algorithm based on diffraction angular spectrum theory Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications 891111
2013 Engineering localized hotspot both in transversal and longitudinal direction by plasmonic coupling between nano-particles and reflective metallic film Chinese Optics Letters S22401
2013 Effect of fabrication errors on binary optical element imaging quality Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications 89110O
2013 Vector analysis of two-dimensional Ronchi grating in the metrology system Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications 89110J
2013 Design and analysis of a novel self-deployable baffle Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications 890758
2013 The impact of polarization on metrology performance of the lateral shearing interferometer Proceedings of SPIE: Optical Measurement Systems for Industrial Inspection VIII 87882F
2013 1.5 kW incoherent beam combining of four fiber lasers using adaptive fiber-optics collimators IEEE Photonics Technology Letters 1286-1289
2013 Speed-up single image dehazing using double dark channels Proceedings of SPIE: Fifth International Conference on Digital Image Processing, ICDIP 2013 88780A
2013 Prediction control algorithm for close-loop adaptive optical system 6th IFAC Symposium on Mechatronic Systems, MECH 2013 276-284
2013 Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements Optics Letters 40-42
共68页  首页上5页上一页2627282930下一页下5页尾页
中国科学院   版权所有 © 中国科学院光电技术研究所  单位邮编:610209 备案号:蜀ICP备05022581号
单位地址:中国四川省成都市双流350信箱 电子邮件:dangban@ioe.ac.cn