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论文编号: |
2013-2017 |
作者: |
Fang, Liang(1); Pan, Li(1); Wang, Changtao(1); Luo, Xiangang(1) |
刊物名称: |
Microelectronic Engineering |
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论文题目英文: |
Superlens imaging lithography for high aspect ratio sub-wavelength pattern employing trilayer resist process |
年: |
2013 |
卷: |
110 |
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页: |
35-39 |
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