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论文编号: |
2013-2010 |
作者: |
Wang, Song(1,2); Yang, Wei(1); Wu, Shi-Bin(1) |
刊物名称: |
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications |
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论文题目英文: |
Effect of fabrication errors on binary optical element imaging quality |
年: |
2013 |
卷: |
8911 |
期: |
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页: |
89110O |
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