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论文编号: |
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作者: |
Huang, QP (Huang, Qiuping); Li, BC (Li, Bincheng) |
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JOURNAL OF APPLIED PHYSICS 卷: 111 期: 9 文献号: 093729 DOI: 10.1063/1.4716032 |
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论文题目英文: |
Photocarrier radiometry of ion-implanted and thermally annealed silicon wafers with multiple-wavelength excitations |
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2012 |
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收录类别: |
SCI |
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