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论文题目: 发表年度: 第一作者:
 
年度 论文题目 期刊 页 收录情况
2014 An analysis of the optimal size of image sensors in free space optic systems Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging 92840R
2014 A method of color correction of camera based on HSV model Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging 92840G
2014 A sampling method to measure surface roughness of circular flat Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92820J
2014 The optical surface defect inspection by fringe reflection Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928210
2014 The impact of polarization on grating performance of the lateral shearing interferometer Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92822J
2014 Simultaneous phase-shifting interferometry study based on the common-path Fizeau Interferometer Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92821Z
2014 An autonomous orbit determination method for MEO&LEO satellite Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928213
2014 High accurate subaperture testing Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92822H
2014 FSM model correlation identification method based on Invert-Repeated m-Sequence Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928220
2014 Source optimization using simulated annealing algorithm Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928239
2014 A scenes recognition method based on image complexity Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928221
2014 Removal of surface figure deformation due to gravity in optical test Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928209
2014 Design of high-bandwidth FSM driving circuit of ATP system for laser communications Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928236
2014 Discussion on a method of target's infrared feature extraction Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92823A
2014 Experiment and analysis of computer generated hologram for testing aspheric surface Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 928215
2014 Design of twin computer-generated hologram for absolute testing of aspheric surfaces Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92821M
2014 Mirror pendulum pose measurement by camera calibration Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92820F
2014 Analysis of the atmosphere back-scattering in active detecting Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment 92821X
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